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Fault modeling and testing of flash memories
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| Auteur / Autrice : | Olivier Ginez |
| Direction : | Patrick Girard, Serge Pravossoudovitch |
| Type : | Thèse de doctorat |
| Discipline(s) : | Micro-électronique |
| Date : | Soutenance en 2007 |
| Etablissement(s) : | Montpellier 2 |
Mots clés
FR