TY - THES DP - http://www.theses.fr/2017MONTS087 TI - Analysis of single event radiation effects and fault mechanisms in SRAM, FRAM and NAND Flash : application to the MTCube nanosatellite project AU - Gupta, Viyas A3 - Dilillo, Luigi; Wrobel, Frédéric PY - 2017 N1 - Thèse de doctorat Électronique Montpellier 2017 N1 - 2017MONTS087 UR - http://www.theses.fr/2017MONTS087/document ER -